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Mask Data Preparation

  • Generation of Multi Project Wafers (MPWs) or shuttles
  • Generation of complex reticles
  • Intuitive mask set creation
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Toolbox

  • Powerful toolbox for GDSII/OASIS ®/Mebes operations
  • Direct read and write gzip files
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Dummy Filling

  • 3rd Generation of dummy filling
  • High speed parallel processing
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GOTdiff

Layout database comparator:

  • Geometry-based signature
  • Ultra-fast signature comparison
  • Intellectual property protection
  • High performance XOR
  • Standard error file generation
  • Parallelism for unsurpassed performance
  • Client/server mode for GUI customization

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Xyalis - New MDP Product


News & Press

XYALIS at DAC conference 2019 : booth #946


- XYALIS introduces a SQL Database Communication Link to further integrate its Mask Data Preparation (MDP) suite in customer design and manufacturing flows.   The industry now faces new challenges: complex stitching, 3D chips, MPW or... [Continue Reading]

Geometry-based signature for layout database comparison


- Grenoble – May 31st, 2018 – XYALIS unveils a new method to compare layouts databases using a geometry-based signature enabling a safe and fast traceability process. Read the article on TechDesignForum. Exchanges of layout descriptions between... [Continue Reading]

XYALIS at DAC conference 2018 : booth #1610


- Leveraging years of leadership in layout finishing, XYALIS introduces a unique geometry-based signature enabling a safe and fast traceability process. It is tailored to handle the multiplicity of design styles and representation standards specific to electronic... [Continue Reading]