Mask Data Preparation
- Generation of Multi Project Wafers (MPWs) or shuttles
- Generation of complex reticles
- Intuitive mask set creation
Toolbox
- Powerful toolbox for GDSII/OASIS ®/Mebes operations
- Direct read and write gzip files
GOTdiff
Layout database comparator:
- Geometry-based signature
- Ultra-fast signature comparison
- Intellectual property protection
- High performance XOR
- Standard error file generation
- Parallelism for unsurpassed performance
- Client/server mode for GUI customization
News & Press
XYALIS at DAC conference 2019 : booth #946
April 12th, 2019 - News XYALIS introduces a SQL Database Communication Link to further integrate its Mask Data Preparation (MDP) suite in customer design and manufacturing flows. The industry now faces new challenges: complex stitching, 3D chips, MPW or... [Continue Reading]
Geometry-based signature for layout database comparison
June 5th, 2018 - News Grenoble – May 31st, 2018 – XYALIS unveils a new method to compare layouts databases using a geometry-based signature enabling a safe and fast traceability process. Read the article on TechDesignForum. Exchanges of layout descriptions between... [Continue Reading]
XYALIS at DAC conference 2018 : booth #1610
May 30th, 2018 - News Leveraging years of leadership in layout finishing, XYALIS introduces a unique geometry-based signature enabling a safe and fast traceability process. It is tailored to handle the multiplicity of design styles and representation standards specific to electronic... [Continue Reading]
|
|
|
|
To build reliable flows involving data exchange with other tools and equipments, XYALIS is fully compliant with SEMI standards. |
