New release of our hybrid dummy fill tool, GTstyle


GRENOBLE, France, August 21st, 2007 In addition to all exclusive functionnalities such as roughness management or parasitics reduction, GTstyle v2.2 provides new great features:     Full Oasis compatibility     Management of multiple size dummy cells     Automatic interconnection of dummy …

XYALIS announce an Advanced Methodology for Building CMP Models


GRENOBLE, France – June 1st, 2007 XYALIS will be able to provide high accuracy thickness measurements on wafers. XYALIS announce today that thanks to “non destructive” nanometric measurement equipment’s, XYALIS is able to build Chemo Mechanical Planarization (CMP) models. These …

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