New release of our hybrid dummy fill tool, GTstyle
August 21st, 2007
GRENOBLE, France, August 21st, 2007 In addition to all exclusive functionnalities such as roughness management or parasitics reduction, GTstyle v2.2 provides new great features: Full Oasis compatibility Management of multiple size dummy cells Automatic interconnection of dummy …
XYALIS announce an Advanced Methodology for Building CMP Models
June 1st, 2007
GRENOBLE, France – June 1st, 2007 XYALIS will be able to provide high accuracy thickness measurements on wafers. XYALIS announce today that thanks to “non destructive” nanometric measurement equipment’s, XYALIS is able to build Chemo Mechanical Planarization (CMP) models. These …
STMicroelectronics QUALIFIES XYALIS GTSMOOTH OXIDE THICKNESS ESTIMATION TECHNOLOGY
April 5th, 2004
Grenoble, France – XYALIS announced today that STMicrolectronics, after several month of validation, has qualified GTsmooth post CMP oxide thickness estimation capabilities
